First Draft Micrometer Calibration Procedure

[wesatwork]

In Reply to Parent Post by wesatwork

8.2 doesn't address the disposition of parts that were measured with the out-of-cal device, only the micrometer itself. The standard asks that you also take appropriate action on any product affected as well.

It's fine if you want to have a separate procedure for outside micrometers only, but you're setting precedence. An individual procedure for each device (which will include repeating redundant info if you want to preserve the "look and feel" from procedure to procedure) is going to very time consuming and unnecessary work, especially for someone who seems to be pinched for documentation time.

At our work place, we have ONE procedure for calibration but we have many WI's, one for each type of device. If, for whatever reason, you need to make a change to the upper (general) areas of the procedure that are common to each, you're looking at having to revise each and every one of them to ensure consistency.

On another note, you can depend on engrained behavior, but in my experience, documenting it just once can save you future headaches. The prcedure doesn't specifically say that cal is required after a drop, so if it isn't carried out, the fault only lies with the procedure.

In order to meet a deadline I am submitting some procedures in this current format. I do see value in what you are saying, in regards to having a higher level calibration document and numerous/individual calibration process steps. Moving forward I may write some more device procedures in the same format and begin a draft (I am green and still working out the big picture ideas) for the higher level calibration document.