Hello all! We are preforming single fault analysis to determine if there is a source of ignition in an oxygen rich environment for our ME device. Our approach has been to determine if any components have the possibility of reaching 300C given the fault of any other single component. This has been through a sort of whitepaper analysis of the schematics.
I have a feeling we may be interpreting the IEC 60601 standards incorrectly somewhere as this method of analysis seems to be near impossible to pass without taking into account the probability of a fault occurring.
There is a particular repeating situation we have run into with ICs which leads me to question if we can argue negligible probability of the fault occurring. As an example, if we have an IC being powered with say 3.3V and an internal short to ground occurs in the IC, should this be considered as a single fault? While it is possible for an IC to fail in such a way, I believe it is extremely unlikely - but is it to the point of being a negligible risk?
Would love to hear anyone else's thoughts on this, any help is much appreciated!
I have a feeling we may be interpreting the IEC 60601 standards incorrectly somewhere as this method of analysis seems to be near impossible to pass without taking into account the probability of a fault occurring.
There is a particular repeating situation we have run into with ICs which leads me to question if we can argue negligible probability of the fault occurring. As an example, if we have an IC being powered with say 3.3V and an internal short to ground occurs in the IC, should this be considered as a single fault? While it is possible for an IC to fail in such a way, I believe it is extremely unlikely - but is it to the point of being a negligible risk?
Would love to hear anyone else's thoughts on this, any help is much appreciated!