A
AndrewRSundaresan
Hi forum users,
I'm trying to design a Gage R&R Study for Attribute (Pass/Fail) data, where the test is a destructive (HiPot Voltage test).
The tester is an automated tester, so there is no Operator component.
My questions are:
1) If the "Fail" rate is low (~2-4%), what should the sample size be?
2) Is it possible to do a Attribute Gage Study with destructive testing, and how would one do this? Is there such a thing as a Nested Attribute Gage study?
Thanks a bunch,
Andrew
I'm trying to design a Gage R&R Study for Attribute (Pass/Fail) data, where the test is a destructive (HiPot Voltage test).
The tester is an automated tester, so there is no Operator component.
My questions are:
1) If the "Fail" rate is low (~2-4%), what should the sample size be?
2) Is it possible to do a Attribute Gage Study with destructive testing, and how would one do this? Is there such a thing as a Nested Attribute Gage study?
Thanks a bunch,
Andrew