Hello Everyone !
First post here after > 7 yrs reading the forum
I don't think my question was previously answered and it is in relation with the ISO 2859-1 Standard.
My problem is the following :
I want to inspect a batch of plastic part for cosmetic defects, some are judged major with an AQL set to 1.0% and some are judged minor with an AQL set to 4.0%. I inspect per general level I (the inspection is long and tedious and for cosmetic aspect I don't think it is worth using II level) and my batch is 500 pieces. According to the ISO standard I have a sampling size code F (20 parts)
If I want to inspect the major defects for the AQL 1.0% I need to switch and use sampling size E (13parts).
BUT (and here is my problem) :
What should I use for the inspection of the minor defect : Is it fine to stay with a E sampling ?
Practically this makes sense but does it work with the thoery ? The good aspect of staying with the E samling is that I do not have to ask my operator to perform another sampling + there is a risk to find major defect in the new sampling. In addition this raises questions as to how to do this new sampling : should I take a complete new sample ? or should I just pick 7 additional parts ?
Could you please advise ?
thanks !!
Robin
First post here after > 7 yrs reading the forum
I don't think my question was previously answered and it is in relation with the ISO 2859-1 Standard.
My problem is the following :
I want to inspect a batch of plastic part for cosmetic defects, some are judged major with an AQL set to 1.0% and some are judged minor with an AQL set to 4.0%. I inspect per general level I (the inspection is long and tedious and for cosmetic aspect I don't think it is worth using II level) and my batch is 500 pieces. According to the ISO standard I have a sampling size code F (20 parts)
If I want to inspect the major defects for the AQL 1.0% I need to switch and use sampling size E (13parts).
BUT (and here is my problem) :
What should I use for the inspection of the minor defect : Is it fine to stay with a E sampling ?
Practically this makes sense but does it work with the thoery ? The good aspect of staying with the E samling is that I do not have to ask my operator to perform another sampling + there is a risk to find major defect in the new sampling. In addition this raises questions as to how to do this new sampling : should I take a complete new sample ? or should I just pick 7 additional parts ?
Could you please advise ?
thanks !!
Robin