H
hemix81
Hello!
Do you have any suggestions how to do an attribute gage R&R for the repair station that follows AOI (automated optical inspection)? AOI inspects defects of PCB's visually and saves information to the database.
There are many operators that inspect defects AOI has noticed and they have to fix and confirm the defects. We would like to know if there is huge difference how operators detect defects.
There is a quality specialist who is very talented; maybe she should check the status (accept/reject) of samples first. There is different information what is suitable number of samples. Let’s assume that 4 operators would participate attribute gage R&R. Each of them would evaluate samples twice. What would be good number of samples? Some articles say that it has to be 20-30, but in some examples there is only 10-15 samples used.
Appraisers shall not know that they are performing a test, because we want the results that don’t differ much from normal inspection operation. They also shouldn’t fix and confirm the defects, as the others will inspect the same samples. There is the problem, how to perform the test without telling them about it.
Do you think that Go / No go data is the most appropriate or can we use ordinal attribute gage? It is possible to classify defects like missing component, short circuit etc. I would say that it is quite difficult to define level of a defect e.g. from 1 to 5. What do you think? If AOI tells that the solder joint is missing, you agree or disagree with it.
Thanks in advance.
Heidi
Do you have any suggestions how to do an attribute gage R&R for the repair station that follows AOI (automated optical inspection)? AOI inspects defects of PCB's visually and saves information to the database.
There are many operators that inspect defects AOI has noticed and they have to fix and confirm the defects. We would like to know if there is huge difference how operators detect defects.
There is a quality specialist who is very talented; maybe she should check the status (accept/reject) of samples first. There is different information what is suitable number of samples. Let’s assume that 4 operators would participate attribute gage R&R. Each of them would evaluate samples twice. What would be good number of samples? Some articles say that it has to be 20-30, but in some examples there is only 10-15 samples used.
Appraisers shall not know that they are performing a test, because we want the results that don’t differ much from normal inspection operation. They also shouldn’t fix and confirm the defects, as the others will inspect the same samples. There is the problem, how to perform the test without telling them about it.
Do you think that Go / No go data is the most appropriate or can we use ordinal attribute gage? It is possible to classify defects like missing component, short circuit etc. I would say that it is quite difficult to define level of a defect e.g. from 1 to 5. What do you think? If AOI tells that the solder joint is missing, you agree or disagree with it.
Thanks in advance.
Heidi

