CNC Probe Qualification and DME Interface

V

ValentJim

#1
Recently at my company we upgraded our Zeiss sofware to Calypso 5.0. We have had alot of issues with calibration since then. Mainly that we can no longer export the calibration data from Calypso and import it into the DME interface. I tried to use the CNC probe qualification but it wants to qualify all probe angles. for this to work you would need to index the master sphere nearly every time the CMM switches angles. We have 90+ angles for just one probe. I know it sounds extreme but they are all necessary. We are losing a lot of time qualifying all of them individually. Does any one know of a way to selectively qualify probe angle or configure the RC list to select which angles you wish to calibate. I hope my explanation was sufficient.
 
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R

Randy Lefferts

#3
Recently at my company we upgraded our Zeiss sofware to Calypso 5.0. We have had alot of issues with calibration since then. Mainly that we can no longer export the calibration data from Calypso and import it into the DME interface. I tried to use the CNC probe qualification but it wants to qualify all probe angles. for this to work you would need to index the master sphere nearly every time the CMM switches angles. We have 90+ angles for just one probe. I know it sounds extreme but they are all necessary. We are losing a lot of time qualifying all of them individually. Does any one know of a way to selectively qualify probe angle or configure the RC list to select which angles you wish to calibate. I hope my explanation was sufficient.
Hi Valentjim,

If you don't find the answer you are looking for here, you may want to check out http://www.cmmguys.com. There are some knowledgeable CMM folks over there and that site is pretty much only about CMM, the hardware, software, etc.

Good luck.
 
T

True Position

#4
Recently at my company we upgraded our Zeiss sofware to Calypso 5.0. We have had alot of issues with calibration since then. Mainly that we can no longer export the calibration data from Calypso and import it into the DME interface. I tried to use the CNC probe qualification but it wants to qualify all probe angles. for this to work you would need to index the master sphere nearly every time the CMM switches angles. We have 90+ angles for just one probe. I know it sounds extreme but they are all necessary. We are losing a lot of time qualifying all of them individually. Does any one know of a way to selectively qualify probe angle or configure the RC list to select which angles you wish to calibate. I hope my explanation was sufficient.
I'm having a little trouble understanding, let me see if I understand:

You have multiple probe assemblies (with multiple stylii each) and you want to qualify them. Some of the individual assemblies need the master sphere rotated to different orientations to get enough coverage for accurate qualification.

I do not know of an easy solution to your problem, since the automated 'Qualify Probe Assembly' feature generally checks each stylii on the assembly, which for you would require rotating and locating the sphere with the master probe.

One possible solution:
Purchase/Make a multi-sphere master probe fixture that would check anything. Q-Mark sells a two sphere fixture as an off the shelf item. I have something similar and it makes things simple.

Complex solution:
Create multiple stylus holders for each rotation and create multiple probe assemblies for each rotation.

If you have three master sphere rotations you can have the each physical holder have 4 different holders in the automatic probe changing menu, then you can create new probe assemblies that only contain the stylii that use that rotation. Then you just create a probe qualification program that grabs these new probe assemblies and holders by rotation. Then you can just create a qualification program for the first rotation probes, run it, rotate the sphere and locate it, then run the next program.

Also, try calling Zeiss phone support, there's likely an easy answer.
 
V

ValentJim

#5
I'm having a little trouble understanding, let me see if I understand:

You have multiple probe assemblies (with multiple stylii each) and you want to qualify them. Some of the individual assemblies need the master sphere rotated to different orientations to get enough coverage for accurate qualification.

I do not know of an easy solution to your problem, since the automated 'Qualify Probe Assembly' feature generally checks each stylii on the assembly, which for you would require rotating and locating the sphere with the master probe.

One possible solution:
Purchase/Make a multi-sphere master probe fixture that would check anything. Q-Mark sells a two sphere fixture as an off the shelf item. I have something similar and it makes things simple.

Complex solution:
Create multiple stylus holders for each rotation and create multiple probe assemblies for each rotation.

If you have three master sphere rotations you can have the each physical holder have 4 different holders in the automatic probe changing menu, then you can create new probe assemblies that only contain the stylii that use that rotation. Then you just create a probe qualification program that grabs these new probe assemblies and holders by rotation. Then you can just create a qualification program for the first rotation probes, run it, rotate the sphere and locate it, then run the next program.

Also, try calling Zeiss phone support, there's likely an easy answer.
Thank you. I will look into the sphere fixture. would it be safe to assume that each sphere on the fixture system would be a different "reference sphere"?

Just to clarify our CMM has an articulating head. This allows us to use alot of different angle combinations for each probe assemsely. We now have five different probes asseblies. I have thought about creating different stylii for each position example.. A0 B0 position 1, position 1 being the position the master sphere needs to be in to qualify that perticular angle. Well we will see what Ziess says Thanks all!:D
 
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