A
anilo
we design and manifacture electronic engine management system for automotive sector.
Our Client want we define Cpk...
But this seems to be realized for a mechanical process, where i can measure dimension and tolerance, and so i can see either the process is in control or out of control.
But in electronic, where the critical elements are hundreds, what i must measure?
Can I avoid to classify every single defects, and focus only on the Printed circuit which fails?
P.S.: Do you know where i can find standards related to statistic (such as ISO/TR 13425:"Guidelines for the Selection of Statistical Methods in Standardization and Specification" or similar)?
Thanks all
Anilo
Our Client want we define Cpk...
But this seems to be realized for a mechanical process, where i can measure dimension and tolerance, and so i can see either the process is in control or out of control.
But in electronic, where the critical elements are hundreds, what i must measure?
Can I avoid to classify every single defects, and focus only on the Printed circuit which fails?
P.S.: Do you know where i can find standards related to statistic (such as ISO/TR 13425:"Guidelines for the Selection of Statistical Methods in Standardization and Specification" or similar)?
Thanks all
Anilo