Gage R&R automated test equipment

#1
Hello,

I'm pretty new to the field of MSA/GR&R and was assigned to do a study on our automated test equipment.

First, let me explain the scenario:
In my field at the end of the manufacturing process all parts will be electrical tested by an automated test equipment (ATE). This ATE consists of many voltage/current sources and voltage/ampere meters. The single part will be automatically placed in the teststation by a so-called handler (with multiple teststations) and the ATE does measurements (breakdown voltages, leakage currents, gain etc.) and gives a BIN code back to the handler which than knows if the part is pass or fail. The ATE can give back additional BIN codes such as passed the first 5 test but failed the last. But for sake of simplicity lets only look at pass/fail. That being said, the ATE does not only do attribute measurements but measures the true value and then decides if pass or fail according to a given spec.

Since we are measuring semiconductors there is a variation in the part itself which cannot be neglected. Even if we choose chips from the same wafer the variation across the wafer is significant.

Now my thoughts about the task:
If we look at the ATE as a blackbox which only gives back pass or fail - I would suggest to do an attributive study with 50 parts and check if the ATE gives back the same results in a given time frame (let's say test them each shift for one week)
-> this would be the "easiest" but from my point of view I'm making the assumption that inside of the ATE is "empty" and ATE can only say pass/fail

If we look at the ATE (black box) and handler as one measuring system. The handler has 3 appraiser (the test stations) and the ATE gives back pass/ fail - same as the one above but with 3 appraisers as the teststations
-> better because we check if all teststations give back the same result in pass/fail

If we look at the ATE as a measuring system consisting of many small measurement systems. We would have to do a study for all voltage/current sources and meters and check that they give consistent measurements
-> here comes the problem with the part itself. When measuring the gain, the part itself heats up which than changes the gain (physics). This can be "adjusted" by using shorter measuring time etc. Also measuring leakage current in nA range are difficult to do in short time.
-> one solution would be to use high presession resistors which are stable across a wide range, but this bothers me a bit because I'm not using production parts, what works for the resistors does not automatically mean that it will work with the semiconductors, also I'm not taking into account the handling process of the handler.

If we look at the ATE as a measuring system consisting of many small measurement systems and the handler with one teststation. We would load the handler with 50 parts from one batch and start the measurement process and record all data from the ATE. After all have been measured we would do the same 3 time more. With the data we would do ANOVA and look were the variance is coming from
-> we will still have the same problem with the measurements but now really using the machine as intended with production parts.

If we look at the ATE as a measuring system consisting of many small measurement systems and the handler with three teststation. Same as before but we would also have a look at the differences between each teststation.
-> This would be my choice to do because: using production parts, the machine runs as it would normally do, all teststations are in use.
--> the downside here is the technical difficulties we would have to solve. e.g. the parts can not be marked so I can't see which one is in which station (the parts are small QFN) we could trick the handler etc. but this is a different discussion.

Overall, I would not to the first two, because attribute study is for go/no go gauges. The third would be okay, but it would not take into account all the aspects of the measuring system. The fourth and fifth would be my choice.

But what is your opinion on this subject?
 
Elsmar Forum Sponsor

John Predmore

Trusted Information Resource
#2
This is a complicated question. What is the purpose of your study? To validate fitness for use (pass good parts and fail known bad parts)? To investigate differences between the various test-stations testing the same sample parts? To document a range of operating capability, to monitor performance over time or environmental conditions? Or to make improvements? Decide what before how.
 

Miner

Forum Moderator
Leader
Admin
#3
If we look at the ATE as a measuring system consisting of many small measurement systems and the handler with three test stations. Same as before but we would also have a look at the differences between each test station.
-> This would be my choice to do because: using production parts, the machine runs as it would normally do, all test stations are in use.
--> the downside here is the technical difficulties we would have to solve. e.g. the parts can not be marked so I can't see which one is in which station (the parts are small QFN) we could trick the handler etc. but this is a different discussion.

Overall, I would not to the first two, because attribute study is for go/no go gauges. The third would be okay, but it would not take into account all the aspects of the measuring system. The fourth and fifth would be my choice.

But what is your opinion on this subject?
I agree that this option is going to provide you with the best information. We have similar ATEs for our products (not semiconductors, but complex electronic equipment). Same scenario (i.e., multiple stations, pass/fail results based on continuous measurements, etc.). This is the approach that we take.
 
#4
Hello,
thank you both for your answers.

John,
That's a good question. Let me explain it a little bit. If you ask the higher management it is to get the okay from the IATF 16949 auditor. For Q-Manager it is to tick a box, to say we do it.
For me: I want to develop a workflow so we can show customers/auditors and so on that our equipment works and is in accordance with the IATF 16949. Also, I don't want to do things just to do them. So having the information about the measurement errors and where they are occurring can help us improve on the testing itself. Maybe one of the teststations gives the same pass/fail result but measures parameter A different, but still in spec, could show us that the testation gets worn out and the connection sockets are not good anymore.
 

optomist1

A Sea of Statistics
Super Moderator
#5
Hi Manu_, I may have missed it above, but have you contacted the ATE Equip. Mfg.? In many case they will assist and provide insight, as this can be a daunting task...

Cheers...Optomist1
 
Thread starter Similar threads Forum Replies Date
S Attribute Gage R&R - Automated Test Equipment Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 1
R Attribute Gage R&R analysis - Automated test system Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 5
J Gage R&R on Attribute Data Using Minitab 14 - Data from Automated Test Systems Quality Tools, Improvement and Analysis 2
6 Gage R&R on automated test equipment - No reproducibility error? Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 3
Y Is NDC needed for gage used for ATE? Automated Test Equipment IC Testing Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 6
L Gage RandR on automated equipment. IATF 16949 - Automotive Quality Systems Standard 7
C Gage R&R on In-Process Automated Inspection Equipment Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 13
C Multiple Variation Gage R&R for Automated Testers Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 3
Hami812 Gage R&R on Automated Tool that supports Pass/Fail and some Parametric Testing Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 3
I Gage R&R for Automated Measurement Equipment Systems Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 9
T Gage Repeatability for an Automated Leak Tester Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 10
C Multiple Fixture Automated Vision System GR&R (Gage R&R) Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 2
M GR&R (Gage R&R) for Automated Electrical Testing Equipment Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 3
D GR&R (Gage R&R) for Automated Wafer Probe Testers Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 5
S How to carry out Gage R&R for automatic machines? Automated Equipment Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 22
H Attribute Gage R&R for Repair Station Operators - AOI (Automated Optical Inspection) Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 5
A Automated Testing Gage R&R (Repeatability and Reproducibility) Issues Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 4
Howard Atkins Gage R&R with Automated Gages - No Operator Bias? Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 6
T Gage R&R study - Ordinal data Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 6
Q Gage Pin Sets? Calibrate/Verify them all or just a sample size? General Measurement Device and Calibration Topics 9
S If 4 operate to measure, what is the value of k2?(MSA gage R&R) Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 1
S Faro Arm, Gage R&R Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 5
8 MSA--Should I Use Parts or Gage Pins? Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 2
C Gage Block Grade 1 - Calibration Measurement Uncertainty (MU) 15
R Gage Measuring 15 Parts at a Time Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 9
Q Gage calibration in disarray ISO 9000, ISO 9001, and ISO 9004 Quality Management Systems Standards 12
PQ Systems Recipe for Success! 10 Ingredients for a Healthy Gage Management System Using GAGEpack Software 0
D Gage Repeatability for Faro Arm Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 3
S Comparing measurement results for a part from two ring gage General Measurement Device and Calibration Topics 3
M Quick Gage R&R Question Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 9
PQ Systems Best Practices In Gage Management Using GAGEpack Software 0
PQ Systems Gage R&R - 3 Part Series Using GAGEpack Software 0
I Excel based Gage R&R VS Minitab calculation Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 5
R Repeatability Type 1 Gage and Gage R&R Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 4
W Proper gage to use for receiving inspection General Measurement Device and Calibration Topics 9
A GAGE R&R Binomial with master list (for method validation) Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 0
Q Gage calibration / tracking software General Measurement Device and Calibration Topics 5
A R chart from ANOVA gage R&R test Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 12
M Type 1 Gage r study Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 3
T Plug Gage Calibration Calibration and Metrology Software and Hardware 1
L Gage R&R TMV Acceptance Criteria Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 4
S MSA for attribute relation gage Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 3
E Zero part to part variation - Gage R&R project Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 15
M Gage R&R and right way to measure Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 16
B Gage calibration frequency, ISO and IATF - What are the requirements Calibration Frequency (Interval) 3
D Difference between Test Method Validation and Gage R&R Qualification and Validation (including 21 CFR Part 11) 19
R Determining Uncertainty from Gage R&R Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 1
C Correct Calibration Method for Dial Depth Gage General Measurement Device and Calibration Topics 6
C Gage Block Wringing General Measurement Device and Calibration Topics 3
B Gage R&R with NDC=1 Gage R&R (GR&R) and MSA (Measurement Systems Analysis) 19

Similar threads

Top Bottom