GMW3172 - Electrical/Electronic - Temperature cycling and Thermal shock

M

mrspl

#1
:confused: Hello
I´m a newbie at this forum.
A Do have a question. In GMW3172 several equations regarding Temp cycling and temperature shock is stated bur what is the ground of these equations.
Is there only MTBF figures or is it some Weibull analysis or some Newton law I didn´t know about

Please eduqate me.
 
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Marc

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#5
This is a 'niche' question where I suspect not a lot of folks here have experience in. I know several folks here have been involved in military electronics so I would think a few might.

GMW3172 “General Specification Electrical/Electronic," is all I got with a Google.

I was involved in thermal cycling and thermal shock - mainly back in the late 1980's with respect to electronics. I'd have to see the spec - I used Mil Standards like Mil-Std-883 (see http://www.semiconfareast.com/milmethods.htm ) and Mil-Std-202 - (see http://www.espec.com ). Did a lot of different Mil-Std-810 testing.

I can't remember the equations we used back then to set thermal cycling ramps and times, for example, but if you want to post something from the spec you're looking at I might be able to help. Maybe not.

Do you understand the reasoning behind thermal cycling and thermal shock?

AST0302.pdf is an Entela document. In part it reads:

AST Specifications in the Automotive Industry

The Big Three all have specifications for accelerated testing. For several years, a variety of accelerated testing techniques such as HALT, FMVT, MEOST and Key Life have been used. Some of these methods (like Key Life Testing) have been well publicized in the companies’ controlled documents. Others developed on an as-needed basis and are now moving into formal adoption. GM, Ford and Daimler/Chrysler have all issued guidelines for accelerated testing. Some, like GMW3172 “General Specification Electrical/Electronic,” are specific to components or a type of component while others, e.g. GMW8287: “Highly Accelerated Life Testing” or parts of Ford's Reliability Guide are general to all accelerated testing.
 

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