Just to ensure there's no confusion, Annex C is a list of questions to characterize the device and help identify any safety concerns.
Annex E (Table E.1) has example hazards.
Since you're asking about non-use scenarios, are you considering how those operations can affect subsequent device operations (i.e., transportation in temperatures exceeding some threshold could damage the device)? Or are you considering how those operations could harm someone (e.g., testing is done with covers off thereby exposing line voltage to the tester)?
Unfortunately, I don't know of any documents that enumerate either of these. I think most companies do a Process
FMEA (
PFMEA) to consider how the various processes you identified could cause the device to not meet specification.