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Normal evaluation of measurement systems usually involves comparison to process variation or to tolerance. What can one use when what you are measuring is a defect rather than a characteristic of a product or process.
As an example, a scratch that is less than 0.200mm (in length) is acceptable. A scratch that is greater than 0.200mm but less than 0.500mm is a minor defect, greater than 0.500mm but less than 1.000mm is a major defect, and greater than 1.000mm is a critical.
The distribution of scratch (lengths) is exponential, with most items having none or microscopic scratches.
As an example, a scratch that is less than 0.200mm (in length) is acceptable. A scratch that is greater than 0.200mm but less than 0.500mm is a minor defect, greater than 0.500mm but less than 1.000mm is a major defect, and greater than 1.000mm is a critical.
The distribution of scratch (lengths) is exponential, with most items having none or microscopic scratches.
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