P
Phil P
Hello Everyone,
I have a dilemma that I hope someone may be able to hep me with. I am currently investigating the introduction of in-process automated inspection of some of our products (we are a stamping house) and am unsure how to verify that the resolution of the proposed system is sufficient. To clarify my intentions I must state that we also intend to perform regular off-line inspection, as not all necessary parameters can be tested in-process. Off-line inspection is performed to the neccesary four decimal places.
I understand that a general rule of thumb is that any measurement device should have an extra degree of resolution to that of the specification, but this will not be practical for us as the specification is to three decimal places and we cannot find any systems that would be accurate to four.
I have spoken to one of the potential manufacturers he has asked me to check the standard deviation of the parameters to be tested. He has provided the resolution and standard deviation of the measurement system. Should I ensure that the standard deviation of each parameter is greater than the system resolution?
Another potential problem I forsee is applying SPC to the process. If the standard deviation of the parameter is smaller than the resolution of the system I believe that we'll get chunky data, which will not be suitable for analysis.
I'm also a bit worried about the system standard deviation, as the quotation states that it is dynamic. I assume that because this has been stated as 'dynamic' (I haven't come accross that before) it opens the door for aproval of the system with massive variation in results.
Any comments much appreciated.
Best regards,
Phil.
I have a dilemma that I hope someone may be able to hep me with. I am currently investigating the introduction of in-process automated inspection of some of our products (we are a stamping house) and am unsure how to verify that the resolution of the proposed system is sufficient. To clarify my intentions I must state that we also intend to perform regular off-line inspection, as not all necessary parameters can be tested in-process. Off-line inspection is performed to the neccesary four decimal places.
I understand that a general rule of thumb is that any measurement device should have an extra degree of resolution to that of the specification, but this will not be practical for us as the specification is to three decimal places and we cannot find any systems that would be accurate to four.
I have spoken to one of the potential manufacturers he has asked me to check the standard deviation of the parameters to be tested. He has provided the resolution and standard deviation of the measurement system. Should I ensure that the standard deviation of each parameter is greater than the system resolution?
Another potential problem I forsee is applying SPC to the process. If the standard deviation of the parameter is smaller than the resolution of the system I believe that we'll get chunky data, which will not be suitable for analysis.
I'm also a bit worried about the system standard deviation, as the quotation states that it is dynamic. I assume that because this has been stated as 'dynamic' (I haven't come accross that before) it opens the door for aproval of the system with massive variation in results.
Any comments much appreciated.
Best regards,
Phil.
My curiosity is piqued. What product do you stamp with such small tolerances?