Here is something for all the 6S folks.....
6S has traditionally dealt with manufacturing processes and the like, and that is good.....but manufacturing and in fact commerce itself.....relies on measurements.....and therefore on measurement uncertainty (MU).
MU is the mathematical description of errors associated with a measurement. Metrology professionals provide MU as a part of accredited calibration. There are many folks who are teaching and developing MU.
Now, there are instances where - in my opinion (a Hershalism only) - the current models - all of which come from the Metrology world - are not valid for some applications.
Now, 6S folks - if you are up to the challenge - try to develop a SIMPLE method to document MU for a given calibration that is compliant to GUM (Guide to the Expression of Uncertainty in Measurement), also available in the U.S. as ANSI/NCSL Z540-2-1997. It must be compliant to GUM or will be instantly rejected by those of us in the Metrology world.
Remember, the influences - and the NUMBER of influences - of MU for any given calibration will vary from one calibration to the next, and vary from type of calibration to another.
Anyone up to the challenge?
Hershal
6S has traditionally dealt with manufacturing processes and the like, and that is good.....but manufacturing and in fact commerce itself.....relies on measurements.....and therefore on measurement uncertainty (MU).
MU is the mathematical description of errors associated with a measurement. Metrology professionals provide MU as a part of accredited calibration. There are many folks who are teaching and developing MU.
Now, there are instances where - in my opinion (a Hershalism only) - the current models - all of which come from the Metrology world - are not valid for some applications.
Now, 6S folks - if you are up to the challenge - try to develop a SIMPLE method to document MU for a given calibration that is compliant to GUM (Guide to the Expression of Uncertainty in Measurement), also available in the U.S. as ANSI/NCSL Z540-2-1997. It must be compliant to GUM or will be instantly rejected by those of us in the Metrology world.
Remember, the influences - and the NUMBER of influences - of MU for any given calibration will vary from one calibration to the next, and vary from type of calibration to another.
Anyone up to the challenge?
Hershal
