A
Hi,
SPC has been widely used in special characteristics especially on dimensional measurements.
But how about attribute data on defects?
Example: Fabric - Product specification (except testing specification) as below:
Fabric width control is within +-1m, mostly meeting 0, not much variances.
Color variation is through grey scale, is anyone using colorimeter or spectrometer to measure?
Defects allowed are 6m/1s - ie. 1 defect in 6 meter.
Currently using U chart to monitor defects ratio on prioritized reduction plan. Is there any other better method?
TQ.
SPC has been widely used in special characteristics especially on dimensional measurements.
But how about attribute data on defects?
Example: Fabric - Product specification (except testing specification) as below:
Fabric width control is within +-1m, mostly meeting 0, not much variances.
Color variation is through grey scale, is anyone using colorimeter or spectrometer to measure?
Defects allowed are 6m/1s - ie. 1 defect in 6 meter.
Currently using U chart to monitor defects ratio on prioritized reduction plan. Is there any other better method?
TQ.