Rocketman90251
Registered
My company is planning to conduct a reliability demonstration test to show that our product, an electronic circuit board, meets it’s required meantime between failure. We have been debating whether we should count any Out-Of-Box or Dead-On-Arrival failures that occur in our calculation of mean time between failure. In other words, if a card fails, upon initial turn on and check out and before the formal start of the reliability, demonstration test, should the failure be charged and counted as a valid failure for calculating MTBF?
Does anyone have any thoughts on DOA chargeability? Are you aware of any industry, standard or mil spec? That address is judge ability of.DOA failures during reliability, demonstration, testing?
Thanks in advance for any advice.
Does anyone have any thoughts on DOA chargeability? Are you aware of any industry, standard or mil spec? That address is judge ability of.DOA failures during reliability, demonstration, testing?
Thanks in advance for any advice.