A
alongtain
I've got a real-world sampling problem I need some help with.
I'm in the process of checking, both, variable & attribute dimensions on a part I'm manufacturing for my customer. There are about 12 variable dimensions and 4 attribute (GO/NO GO) dimensions. I'm running a 200 piece lot and am checking at a sampling rate of every 4th part (per Z1.4, Level II, AQL=1). This is taking quite a while.
My customer said that if I can show a Cpk of 1.33 or better on the variable data, I can reduce my sample size for those attributes to 13 parts (per Z1.4, Level I, AQL=1). I have performed my Cpk checks and my process is in a tight state of control, so I'm going to reduce my inspection frequency on those dimensions.
The problem I'm having is coming to an agreement with the customer in regard to reducing my attribute checks to z1.4, Level I, AQL=1. They initially stated that I need to check at least 59 pieces out of a 500 piece lot at 95% confidence level and then switched and said they wanted me to check the first 5 lots according to Z1.4, Level II, AQL=1 before reducing my inspection frequency.
I know that my process is in control after checking the first lot and checking 5 lots at 50 pieces per lot vs. 13 is going to require a lot of extra hours of inspection. Is there another standard rationale I can use/reference to convince my customer to let me reduce sampling frequency on the attribute dimensions? Also, my customer said that the 5 lot attribute inspection rule comes from the ANSI/ASQC Z1.4 standard. I don't have a copy of this standard and was wondering if this is correct?
Any help in regard to onducting sampling on variable and attribute data and determining a reasonable rationale for reducing sampling frequency on both data types would be greatly appreciated. I typically run lots from 200 to 2000 pieces and want to put an easy-to-follow system in place for determining that initial lots are in control and reducing sampling on subsequent lots, once control has been proven.
I know this is long-winded, but, I couldn't explain it any quicker.
Thanks,
I'm in the process of checking, both, variable & attribute dimensions on a part I'm manufacturing for my customer. There are about 12 variable dimensions and 4 attribute (GO/NO GO) dimensions. I'm running a 200 piece lot and am checking at a sampling rate of every 4th part (per Z1.4, Level II, AQL=1). This is taking quite a while.
My customer said that if I can show a Cpk of 1.33 or better on the variable data, I can reduce my sample size for those attributes to 13 parts (per Z1.4, Level I, AQL=1). I have performed my Cpk checks and my process is in a tight state of control, so I'm going to reduce my inspection frequency on those dimensions.
The problem I'm having is coming to an agreement with the customer in regard to reducing my attribute checks to z1.4, Level I, AQL=1. They initially stated that I need to check at least 59 pieces out of a 500 piece lot at 95% confidence level and then switched and said they wanted me to check the first 5 lots according to Z1.4, Level II, AQL=1 before reducing my inspection frequency.
I know that my process is in control after checking the first lot and checking 5 lots at 50 pieces per lot vs. 13 is going to require a lot of extra hours of inspection. Is there another standard rationale I can use/reference to convince my customer to let me reduce sampling frequency on the attribute dimensions? Also, my customer said that the 5 lot attribute inspection rule comes from the ANSI/ASQC Z1.4 standard. I don't have a copy of this standard and was wondering if this is correct?
Any help in regard to onducting sampling on variable and attribute data and determining a reasonable rationale for reducing sampling frequency on both data types would be greatly appreciated. I typically run lots from 200 to 2000 pieces and want to put an easy-to-follow system in place for determining that initial lots are in control and reducing sampling on subsequent lots, once control has been proven.
I know this is long-winded, but, I couldn't explain it any quicker.
Thanks,