Attributes charts are used for ‘countable’ events rather than measured results. The most common are when the defect rate is greater than zero. QC failures and field performance such as error rates, defect rates, service events customer complaints. They can also be used for such things as particle counts, accidents, etc.
Your question is quite vague with a large field of possible answers. Can you clarify what your question(s) is? Also it is Holiday weekend in the US so there may be few responses until Tuesday...