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Re: Capability Study on Attribute Data? Visual Inspection
Guys, and experts here, I also need your help. I want to know how to determine the process capability of my machine. My given data are weekly ppm of visual mechanical defects on ICs such as lead defect and package defect.
My idea as step by step procedure to get this are :
1. Get the measurement readings on IC samples that was processed on my machine. Let's say 100 samples. This will give me the value for standard deviation.
2. Determine my limits for parameters on lead and package defect.
3. Substitute the derived values in CPK formula to get the CPK or process capability.
The result will be a value and will tell to me my process capability. This will tell me how far my machine produces defects away from this limits. However, how can I translate the result to the recurrence rate? Or interpret it the chance of having a defect on processed units?
Does my idea posted above is correct? Please help me. I am new in this field. Thank You.
Guys, and experts here, I also need your help. I want to know how to determine the process capability of my machine. My given data are weekly ppm of visual mechanical defects on ICs such as lead defect and package defect.
My idea as step by step procedure to get this are :
1. Get the measurement readings on IC samples that was processed on my machine. Let's say 100 samples. This will give me the value for standard deviation.
2. Determine my limits for parameters on lead and package defect.
3. Substitute the derived values in CPK formula to get the CPK or process capability.
The result will be a value and will tell to me my process capability. This will tell me how far my machine produces defects away from this limits. However, how can I translate the result to the recurrence rate? Or interpret it the chance of having a defect on processed units?
Does my idea posted above is correct? Please help me. I am new in this field. Thank You.